S M MAINUL ISLAM. Physical Resilience in Advanced Microelectronics Manufacturing: Integrating Ai-Driven Fault Detection For Secure Domestic Chip Supply Chains. Acta Scientiae, [S. l.], v. 26, n. 2, p. 701–713, 2025. DOI: 10.22178/acta.26.2.55. Disponível em: https://www.periodicos.ulbra.org/index.php/acta/article/view/599. Acesso em: 20 sep. 2026.